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题名: Sub-nanometer drift correction for super-resolution imaging
作者: Tang, Y ;  Wang, X ;  Zhang, X ;  Li, J ;  Dai, L
刊名: OPTICS LETTERS
出版日期: 2014
卷号: 39, 期号:19, 页码:5685-5688
关键词: PHOTOACTIVATION LOCALIZATION MICROSCOPY ;  OPTICAL MICROSCOPE ;  FLUORESCENCE ;  RECONSTRUCTION ;  REGISTRATION ;  NM
学科分类: Physics
DOI: 10.1364/OL.39.005685
通讯作者: Tang, Y (reprint author), Chongqing Univ, Dept Phys, Chongqing 400044, Peoples R China.
部门归属: [Tang, Y.] Chongqing Univ, Dept Phys, Chongqing 400044, Peoples R China ;  [Tang, Y. ;  Zhang, X. ;  Li, J. ;  Dai, L.] Natl Ctr Nanosci & Technol China, Beijing 100190, Peoples R China ;  [Tang, Y. ;  Wang, X.] Chinese Acad Sci, Inst Theoret Phys, State Key Lab Theoret Phys, Beijing 100190, Peoples R China ;  [Li, J.] Chinese Acad Sci, Inst Chem, Beijing 100190, Peoples R China
英文摘要: Spatial resolution of conventional far-field fluorescence microscopy is limited by diffraction of light. Single-molecule localization microscopy (SMLM), such as (direct) stochastic optical reconstruction microscopy (dSTORM/STORM), and (fluorescence) photoactivation localization microscopy (fPALM/PALM), can break this barrier by localizing single emitters and reconstructing super-resolution image with much higher precision. Nevertheless, a SMLM measurement needs to record a large number of image frames and takes considerable recording time. In this process, sample drift becomes a critical problem and cannot be neglected. In this Letter, we present a sub-nanometer precision, low-cost sample drift correction method based on minimizing normalized root-mean-square error (NRMSE) between bright field images. Two optical configurations are suggested for recording bright field and fluorescence images simultaneously or alternately. The method was demonstrated on simulated data, and better than 0.3 nm drift correction precision was achieved. It was also applied on dSTORM imaging of F-actins of 3T3 cell, and the quality of reconstructed super-resolution image was improved observably. This method does not require special hardware, extra labelling or markers, and no precision decline due to photobleaching. It can be applied as an add-on for SMLM setups and achieves sub-nanometer precision drift correction for post-measurement or real time drift compensation. (C) 2014 Optical Society of America
资助者: National Natural Science Foundation of China [21273053]; National Basic Research Program of China (973 program) [2013CB932804]; Major Research Plan of the National Natural Science Foundation of China [91027045]
收录类别: SCI
原文出处: 查看原文
语种: 英语
WOS记录号: WOS:000343906400055
Citation statistics: 
内容类型: 期刊论文
URI标识: http://ir.itp.ac.cn/handle/311006/15643
Appears in Collections:理论物理所2014年知识产出 _期刊论文

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Recommended Citation:
Tang, Y,Wang, X,Zhang, X,et al. Sub-nanometer drift correction for super-resolution imaging[J]. OPTICS LETTERS,2014,39(19):5685-5688.
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