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Chen, XJ; Titimbo, K; Du, ML
Theoretical studies of the effects of a transverse magnetic field in photodetachment microscopy
发表期刊EPL
语种英语
关键词CLOSED CLASSICAL ORBITS QUANTUM SPECTRA CROSS-SECTION IONIZATION FORMULAS ATOMS
摘要Photodetachment microscopy of monovalent anions is studied theoretically with a uniform transverse magnetic field (B) over arrow superimposed to the electric field (E) over arrow. The main experimental results given by Chaibi et al. (EPL, 82 (2008) 20005) have been reproduced using the closed-orbit theory, and confirmed through the quantum source theory with the energy Green function evaluated by means of the stationary phase approximation. Both theoretical methods yield consistent descriptions of the electron flux distribution for all field intensities and angular momentum of electrons we studied. Our calculations show that the presence of the magnetic field leads to a global displacement of the ring patterns along the (E) over arrow x (B) over arrow-direction, confirming the experimental observations under weak magnetic-field conditions. In addition, we found that the shape and size of the interference patterns change from circular to elliptical as the magnetic field increases. Copyright (C) EPLA, 2018
2018
ISSN0295-5075
卷号123期号:3页码:30008
学科领域Physics
学科门类Physics, Multidisciplinary
DOI10.1209/0295-5075/123/30008
收录类别SCIE
引用统计
文献类型期刊论文
条目标识符http://ir.itp.ac.cn/handle/311006/22842
专题理论物理所科研产出_SCI论文
作者单位1.[Chen, X. J.
2.Titimbo, K.
3.Du, M. L.] Chinese Acad Sci, Inst Theoret Phys, Beijing 100190, Peoples R China
4.Du, M. L.] Univ Chinese Acad Sci, Sch Phys Sci, 19A Yuquan Rd, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Chen, XJ,Titimbo, K,Du, ML. Theoretical studies of the effects of a transverse magnetic field in photodetachment microscopy[J]. EPL,2018,123(3):30008.
APA Chen, XJ,Titimbo, K,&Du, ML.(2018).Theoretical studies of the effects of a transverse magnetic field in photodetachment microscopy.EPL,123(3),30008.
MLA Chen, XJ,et al."Theoretical studies of the effects of a transverse magnetic field in photodetachment microscopy".EPL 123.3(2018):30008.
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