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题名: Two mode photon bunching effect as witness of quantum criticality in circuit QED
作者: Ai Qing ;  Wang YingDan ;  Long GuiLu ;  Sun ChangPu
刊名: SCIENCE IN CHINA SERIES G-PHYSICS MECHANICS & ASTRONOMY
出版日期: 2009
卷号: 52, 期号:12, 页码:1898-1905
关键词: PHASE-TRANSITION ;  ENTANGLEMENT
学科分类: Physics
通讯作者: Long, GL , Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China
部门归属: [Ai, Q; Long, GL] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China; [Wang, YD] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland; [Long, GL] Tsinghua Natl Lab Informat Sci & Technol, Beijing 100084, Peoples R China; [Sun, CP] Chinese Acad Sci, Inst Theoret Phys, Beijing 100080, Peoples R China
英文摘要: We suggest a scheme to probe critical phenomena at a quantum phase transition (OPT) using the quantum correlation of two photonic modes simultaneously coupled to a critical system. As an experimentally accessible physical implementation, a circuit QED system is formed by a capacitively coupled Josephson junction qubit array interacting with one superconducting transmission line resonator (TLR). It realizes an Ising chain in the transverse field (ICTF) which interacts with the two magnetic modes propagating in the TLR. We demonstrate that in the vicinity of criticality the originally independent fields tend to display photon bunching effects due to their interaction with the ICTF. Thus, the occurrence of the OPT is reflected by the quantum characteristics of the photonic fields.
资助者: National Basic Research Program of China[2006CB921106]; National Natural Science Foundation of China[10874098]; ECIST-FET; Swiss SNF; NCCR Nanoscience
收录类别: SCI
原文出处: 查看原文
WOS记录号: WOS:000272622300013
Citation statistics: 
内容类型: 期刊论文
URI标识: http://ir.itp.ac.cn/handle/311006/5205
Appears in Collections:理论物理所1978-2010年知识产出_期刊论文

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Recommended Citation:
Ai Qing,Wang YingDan,Long GuiLu,et al. Two mode photon bunching effect as witness of quantum criticality in circuit QED[J]. SCIENCE IN CHINA SERIES G-PHYSICS MECHANICS & ASTRONOMY,2009,52(12):1898-1905.
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